Overview
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Industry’s leading knife-edge system
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Unique tomographic image reconstruction
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Beam measurements down to 3 microns and up to 9 mm
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Accurately measures profile, position and power
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Multiple detectors versions are available, covering wavelengths from deep UV to 2.7 microns
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Specifications
Ordering Information
Products > Beam Profilers > CKET > Beam Analyzer Pro
The application program is compatible with Windows 8/10/11 OS (32 & 64 bit). For custom integration, an SDK package software is offered as standard.
NG4 and NG9 filters in housing are provided for the Si and UV-Si heads only.
BA3-Si-Pro: 3-blades, Si detector 5mm circular
BA7-Si-Pro: 7-blades, Si detector 9mm square
BA3-UV-Pro: 3-blades, UV-Si detector 5mm circular
BA7-UV-Pro: 7-blades, UV-Si detector 9mm square
BA3-IR3-Pro: 3-blades, InGaAs detector 3mm circular
BA3-IR3E-Pro: 3-blades,InGaAs Enhanced 3mm circular
BA7-IR3-Pro: 7-blades, InGaAs detector 3mm circular
BA7-IR3E-Pro: 7-blades, InGaAs Enhanced 3mm circular
BA3-IR5-Pro: 3-blades, InGaAs detector 5mm circular
BA7-IR5-Pro: 7-blades, InGaAs detector 5mm circular
BA7-IR10-Pro: 7-blades, InGaAs detector 10mm circular
Optional accessories
SAM3-B Beam Sampler: with mounting adapter
Sampling reduction factor 0.0016 average
BA-Fiber: A fiber adapter with an FC connector
BA-Mount: A mount enabling head rotation about the optical axis