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  • Industry’s leading knife-edge system

  • Unique tomographic image reconstruction

  • Beam measurements down to 3 microns and up to 9 mm

  • Accurately measures profile, position and power

  • Multiple detectors versions are available, covering wavelengths from deep UV to 2.7 microns


Ordering Information

Products > Beam Profilers > CKETBeam Analyzer Pro

The application program is compatible with Windows 8/10/11 OS (32 & 64 bit). For custom integration, an SDK package software is offered as standard.

NG4 and NG9 filters in housing are provided for the Si and UV-Si heads only.


BA3-Si-Pro: 3-blades, Si detector 5mm circular
BA7-Si-Pro: 7-blades, Si detector 9mm square
BA3-UV-Pro: 3-blades, UV-Si detector 5mm circular
BA7-UV-Pro: 7-blades, UV-Si detector 9mm square
BA3-IR3-Pro: 3-blades, InGaAs detector 3mm circular
BA3-IR3E-Pro: 3-blades,InGaAs Enhanced 3mm circular
BA7-IR3-Pro: 7-blades, InGaAs detector 3mm circular
BA7-IR3E-Pro: 7-blades, InGaAs Enhanced 3mm circular
BA3-IR5-Pro: 3-blades, InGaAs detector 5mm circular
BA7-IR5-Pro: 7-blades, InGaAs detector 5mm circular

BA7-IR10-Pro: 7-blades, InGaAs detector 10mm circular


Optional accessories

SAM3-B Beam Sampler: with mounting adapter
Sampling reduction factor 0.0016 average
BA-Fiber: A fiber adapter with an FC connector
BA-Mount: A mount enabling head rotation about the optical axis

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