Beam Profiling Solutions
A complete line of laser Beam Profiling over a wide range of sizes and wavelengths from UV to 2.7 microns. Two technologies available; tomographic knife-edge and imaging systems.
Duma's laser beam profiling line offers two technologies:
1) CCD & C-MOS.
2) Tomographic Knife-edge.
Our unique technology enables measurement over a wide spectral range (WSR) from 190 to 1600 nm. Furthermore, measurements down to 0.5 microns with nano-metric resolution are also within our capabilities.
The knife-edge profilers intersect the beam in several different angles and our unique tomographic reconstruction is capable of displaying the beam's intensity distribution map, similar to imaging technologies. The systems will measure from 3 microns up to 9 mm over a spectral range up to 2.7 microns.
SDK package for integration in user application program is standard.