New instrument especially designed for LAM - Laser Additive Manufacturing, and it is based on camera laser beam profiling. Critical parameters such as beam profile and position relative to reference hole are measured in real time.
When positioned on a tabletop, the measuring plane coincides with the machine working plane - the LAM U3 basis.
The LAM U3 offers these capabilities in a compact and versatile unit, which is air-cooled by external pressurized air - without water.
High precision beam full characterization diagnostics for CW lasers up to 4 kWatts.
Wide dynamic range, beam size measurements down to several microns and up to 9 mm.
This is a complete system specially suitable for installation as a part of LAM machine or for offline applications, and is intended for measurements over a relatively short period of time (a few seconds depending on the maximum power applied).
The application program is compatible with Windows 7/8/10 OS (32 & 64 bit). For custom integration, an SDK package software is offered as standard.
LAM-U3: A camera for 350 – 1310 nm with built-in beam sampler and additional interchangeable high power attenuator, concentric mounting adapter to input aperture (see tutorial), USB3.0 cable, software and user manual on CD/Flash Drive, carrying case.
Contact email@example.com for other versions.